XRF & XRD
X-ray Diffraction (XRD) is a multidisciplinary non-destructive analytical method that provides a broad range of data about chemical
composition and crystal structure of natural and industrial materials. Each crystal has a characteristic x-ray pattern which can be used as a fingerprint
for its identification. XRD is most widely used for the identification of crystalline compounds based on their diffraction pattern. Some other applications
of XRD are in geology, material science, chemistry, the science of environment, physics, and pharmaceutical industry.
In order to determine the percentage of elements in a compound, two methods are adoptable. The first method includes the use of
analytical chemistry methods which are mostly based on titration. The other method includes non-destructive analysis of samples by
processing the secondary x-rays emitted from them (samples). This method is called XRF (X-Ray Fluorescence). XRF is used for measuring
the wavelength and intensity of secondary x-rays emitted from constituent elements of the sample. The result helps identify and quantify
the constituent elements. XRF is an appropriate method for the identification of completely unknown samples. The main advantage of
XRF over chemical methods is its capability of obtaining comprehensive high-precision analyses in a short period of time, with a
relatively low cost. XRF has a broad range of applications for a variety of sciences, and nowadays, because of the huge improvements in
this field, the method has been accepted as essential for research laboratories. XRF has the capability of analyzing a wide range of
elements both qualitatively and quantitatively with a very high speed. Due to its high speed and the fact that it does not need the use
of chemical agents, XRF is an environment friendly, inexpensive analytical method.
Services offered in the XRF/XRD Laboratory: