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Scanning electron microscope (SEM)

A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning it with a focused beam of electrons. The electrons interact with electrons in the sample, producing various signals that can be detected and that contain information about the sample's surface topography and composition. The electron beam is generally scanned in a raster scan pattern, and the beam's position is combined with the detected signal to produce an image. SEM can achieve resolution better than 1 nanometer. Specimens can be observed in high vacuum, low vacuum and in environmental SEM specimens can be observed in wet condition.

RMRC material testing laboratory has access to two Scanning Electron Microscope (SEM).
They scan the sample surface with a high-energy beam of electrons. Photographs with a magnification up to 25000X are available.
SEM is used extensively in failure analysis where fracture surfaces are examined to pinpoint cause of failure.

Couple these facilities with a multidisciplinary team of engineers highly trained and experienced personnel who can deformulate the most complex failures with more than thirty years of experience in the field of engineering failure analysis and many completed investigations to our credit. RMRC’s failure analysis team is positioned to provide solutions to virtually any materials failure.

By combining traditional failure analysis techniques with quantitative methods such as fracture mechanics, fatigue analysis, and numerical modeling, RMRC’s technical solutions are unparalleled. This multidisciplinary approach to failure analysis allows us to provide our clients with the cause and time line information that they need, in a manner that is easily understood.