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Scanning electron microscope (SEM, FESEM)

A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning it with a focused beam of electrons. The electrons interact with electrons in the sample, producing various signals that can be detected and that contain information about the sample's surface topography and composition. The electron beam is generally scanned in a raster scan pattern, and the beam's position is combined with the detected signal to produce an image. SEM can achieve resolution better than 1 nanometer. Specimens can be observed in high vacuum, low vacuum and in environmental SEM specimens can be observed in wet condition.


RMRC material testing laboratory has access to two Scanning Electron Microscope (SEM).
They scan the sample surface with a high-energy beam of electrons. Photographs with a magnification up to 25000X are available.
SEM is used extensively in failure analysis where fracture surfaces are examined to pinpoint cause of failure.

Couple these facilities with a multidisciplinary team of engineers highly trained and experienced personnel who can deformulate the most complex failures with more than thirty years of experience in the field of engineering failure analysis and many completed investigations to our credit. RMRC’s failure analysis team is positioned to provide solutions to virtually any materials failure.

By combining traditional failure analysis techniques with quantitative methods such as fracture mechanics, fatigue analysis, and numerical modeling, RMRC’s technical solutions are unparalleled. This multidisciplinary approach to failure analysis allows us to provide our clients with the cause and time line information that they need, in a manner that is easily understood.


Performance testing News

MIRA 3-XMU field emission scanning electron microscope
MIRA 3-XMU field emission scanning electron microscope
MIRA 3-XMU field emission scanning electron microscope is the newest and the most advanced FESEM in Iran and it provides users the advantages of the latest technology. This microscope has the capability to provide topographical and elemental information at a magnification of 1000000X by using four optical detectors (BSE-in beam, SE-in beam, SE, BSE). Another advantage of this device is related to LVSTD detector which enables the possibility of shooting in very low voltages and hence the sample will be less damaged, it also makes it possible to work on polymer materials, layers, and bio samples. It is also equipped with the second generation EDS microanalysis which is so small and it allows to identify the smallest phases. Due to the possibility of adjusting the pressure inside the chamber and capability of high-resolution, ability to work in all areas of science and industry, especially in the field of nano-technology is provided.

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